Details
High Resolution X-Ray Diffractometry And Topography
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CHF 66.35 |
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| Verlag: | Crc Press |
| Format: | |
| Veröffentl.: | 05.02.1998 |
| ISBN/EAN: | 9780203979198 |
| Sprache: | englisch |
| Anzahl Seiten: | 252 |
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Beschreibungen
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
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