Details

Runs and Scans with Applications


Runs and Scans with Applications


Wiley Series in Probability and Statistics, Band 764 1. Aufl.

von: N. Balakrishnan, Markos V. Koutras

CHF 135.00

Verlag: Wiley
Format: PDF
Veröffentl.: 20.09.2011
ISBN/EAN: 9781118150450
Sprache: englisch
Anzahl Seiten: 488

DRM-geschütztes eBook, Sie benötigen z.B. Adobe Digital Editions und eine Adobe ID zum Lesen.

Beschreibungen

Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * "Match" in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
List of Tables. List of Figures. Preface. Introduction and Historical Remarks. Waiting for the First Run Occurrence. Applications. Waiting for Multiple Run Occurrences. Number of Run Occurrences. Sooner/Later Run Occurrences. Multivariate Run-Related Distributions. Applications. Waiting for the First Scan. Waiting for Multiple Scans. Number of Scan Occurrences. Applications. Bibliography. Author Index. Subject Index.
“…many excellent features…” (Statistical Methods in Medical Research, No.13, 2004) "...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature..." (Technometrics, Vol. 44, No. 4, November 2002) "...highly recommended…well done and perfectly edited..." (Journal of the American Statistical Association, December 2002) "...a great resource..." (International Journal of General Systems, Vol. 32, 2003)
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley). MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.
Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * "Match" in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.

Diese Produkte könnten Sie auch interessieren:

Modeling Uncertainty
Modeling Uncertainty
von: Moshe Dror, Pierre L'Ecuyer, Ferenc Szidarovszky
PDF ebook
CHF 271.50
Continuous Bivariate Distributions
Continuous Bivariate Distributions
von: N. Balakrishnan, Chin Diew Lai
PDF ebook
CHF 130.00
Nonlinear Regression with R
Nonlinear Regression with R
von: Christian Ritz, Jens Carl Streibig
PDF ebook
CHF 82.50